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Upright Metallurgical Microscope

SuXma® Met B / Met BD Upright Metallurgical Microscope

Routine upright metallurgical microscope range for metallography laboratories, quality control and industrial inspection.

Optical SystemObservation ModesMagnification

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Recommended source size

1600 × 1200 px

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Recommended source size

1200 × 900 px

Why Choose This Model

Routine laboratory configuration

Selected for daily metallography, grain size review, phase analysis and production inspection tasks.

Imported High-Quality Optical System

Infinity optics keep routine material structures clear for visual review and image records.

Brightfield and darkfield choice

Met B is the brightfield configuration, while Met BD adds darkfield capability for broader inspection needs.

Large sample handling

Large stage and travel range help laboratories handle mounted samples and routine industrial specimens.

Key Technical Features

Optical System

Imported High-Quality Optical System with infinity plan objectives for routine metallurgical observation.

Observation Modes

Met B uses brightfield observation. Choose Met BD when the inspection also requires darkfield.

Magnification

Configured for metallurgical observation up to approximately 1000x magnification.

Stage

Large stage approx. 280 x 270 mm with approx. 200 x 200 mm travel.

Viewing Tube

The trinocular tube retains visual observation while a camera records images.

Focusing

Coaxial coarse and fine controls set focus during routine laboratory inspection.

Typical Applications

Routine Metallography

A practical use of the upright metallurgical microscope configuration for prepared material examination.

Grain Size Analysis

Stable optics keep prepared microstructures in focus while representative fields are captured.

Phase Analysis

Stable optics keep prepared microstructures in focus while representative fields are captured.

Cast Iron Analysis

Prepared casting samples reveal graphite form and matrix structure under reflected light.

Heat Treated Components

Helps operators review microstructural response after heat treatment on properly prepared sections.

Quality Control

Fits repeatable shop-floor or laboratory checks where straightforward sample handling matters.

Research and Education

Direct optical control suits teaching, method development and comparative material studies.

Optional Features & Accessories

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Recommended source size

300 × 200 px

Polarizer / Analyzer

Polarization accessories can be selected for suitable metallurgical observation methods.

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Recommended source size

300 × 200 px

Additional Objectives

Objective options can be reviewed around magnification and working distance needs.

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Recommended source size

300 × 200 px

German-made USB Camera Options

Select the camera from the required image resolution, measurement and analysis method.

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Recommended source size

300 × 200 px

DeXel Software Integration

Compatible systems can connect with DeXel software for calibrated measurement, documentation and reporting.

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Recommended source size

300 × 200 px

Calibration Slides

Calibration slides support measurement setup, verification and routine microscope calibration practice.

Microscopes and Stereozooms

Main category page for SuXma® microscopes, stereo zoom systems, cameras, accessories and upgrades.

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DeXel-Metallography®

Metallography Image Analysis Systems for microscope-based measurement, documentation and reporting.

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Image Analysis Systems

Software for metallography, weld analysis, particle analysis and dimensional measurement.

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Sample Preparation

Cutting, mounting, grinding and polishing equipment for prepared metallographic samples.

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Metallography Consumables

High-quality imported consumables for consistent cutting, mounting, grinding and polishing.

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Microhardness Testers

Vickers and Knoop hardness testers for material evaluation and heat-treatment verification.

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Discuss SuXma® Met B / Met BD for your laboratory

Share the specimen geometry, observation method, camera interface and required records. Conation will confirm the SuXma® configuration.

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